Scanning probe microscopy - PDFSEARCH.IO - Document Search Engine

Scanning probe microscopy
Results: 577

#	Item
391	APPLIED PHYSICS LETTERS VOLUME 79, NUMBER 6 6 AUGUST 2001 Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-07-14 19:23:31 Microscope Science Scientific method Scanning probe microscopy Nanocrystal Nanomaterials
392	Microsoft Word - STEM Program Plan Career and Technical Studies Concentration[removed]update).doc Add to Reading List Source URL: coe.csusb.edu Language: English - Date: 2013-06-04 17:27:03 Electrochemical scanning tunneling microscope Scanning probe microscopy Academic term
393	Objective Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe microscopes, to enable accurate dimensional, force, and material property Add to Reading List Source URL: www.nist.gov Language: English - Date: 2012-10-04 11:43:14 Nanotechnology Technology Intermolecular forces Atomic force microscopy Cantilever Canton of Neuchâtel Microscopy Microscope Calibration Science Scientific method Scanning probe microscopy
394	Microsoft Word - STEM Program Plan K-8 Mathematics Concentration[removed]update).doc Add to Reading List Source URL: coe.csusb.edu Language: English - Date: 2013-06-04 17:27:39 Electrochemical scanning tunneling microscope Scanning probe microscopy Mathematics education
395	REVIEW OF PROGRESS IN QUANTITATIVE NDE Bowdoin College Brunswick, Maine July 29-August 3, 2001 Add to Reading List Source URL: www.qndeprograms.org Language: English - Date: 2010-03-31 14:42:55 Measuring instruments Microscopes Superconductivity Scanning probe microscopy Josephson effect Scanning SQUID microscopy Scanning SQUID microscope SQUID Nondestructive testing Physics Electromagnetism Science
396	JOURNAL OF APPLIED PHYSICS 102, 074112 共2007兲 Single crystalline BaTiO3 thin films synthesized using ion implantation induced layer transfer Young-Bae Park, Kenneth Diest,a兲 and Harry A. Atwater Thomas J. Watson L Add to Reading List Source URL: daedalus.caltech.edu Language: English - Date: 2007-10-11 17:25:00 Condensed matter physics Semiconductor device fabrication Electrical phenomena Materials science Piezoresponse force microscopy Scanning probe microscopy Piezoelectricity Epitaxy Hydrogen Physics Chemistry Electromagnetism
397	Microsoft Word - serri-fact-sheet-AFM.doc Add to Reading List Source URL: www.engineering.olemiss.edu Language: English - Date: 2010-02-17 15:16:57 Chemistry Microscopy Intermolecular forces Nanotechnology Atomic force microscopy Optical microscope Microscope Cantilever Photoconductive atomic force microscopy Science Scientific method Scanning probe microscopy
398	NanoTester : PCI-AFM (Point-contact Current Imaging Atomic Force Microscopy) Prof. Takuya MATSUMOTO (Osaka University) 1. NanoTester : PCI-AFM PROBLEMS Add to Reading List Source URL: www.jst.go.jp Language: English - Date: 2012-11-19 02:13:12 Intermolecular forces Atomic force microscopy Chemistry Computer buses Carbon nanotube Conventional PCI Scanning probe microscopy Scientific method Science
399	JOURNAL OF APPLIED PHYSICS VOLUME 95, NUMBER 11 1 JUNE 2004 Add to Reading List Source URL: www.kschwabresearch.com Language: English - Date: 2007-07-15 21:49:19 Magnetism Physical quantities Magnetic force microscope Scanning probe microscopy Magnetic field Ferromagnetism Magnet Domain wall Physics Electromagnetism Magnetic ordering
400	The Schottky contact is a fundamental metal-semiconductor contact, and Schottky diodes are currently one of the few commerciall Add to Reading List Source URL: www.materials.cmu.edu Language: English - Date: 2010-08-28 11:56:56 Condensed matter physics Spin polarized scanning tunneling microscopy Scanning tunneling microscope Superparamagnetism Magnetization reversal Ferromagnetism Magnetism Magnetic force microscope Conductive atomic force microscopy Scanning probe microscopy Physics Materials science

UPDATE